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Process capability index worksheet

Calculate Cp and Cpk from a quality engineer’s validated process statistics.

01Enter your values

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Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index. Negative Cpk means the mean is outside a limit.

Example

How it works

Calculate Cp and Cpk from a quality engineer’s validated process statistics.

Cp = (USL−LSL)/(6σ); Cpu = (USL−μ)/(3σ); Cpl = (μ−LSL)/(3σ); Cpk = min(Cpu,Cpl)

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About this tool

Calculate Cp and Cpk from a quality engineer’s validated process statistics.

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index. Negative Cpk means the mean is outside a limit.

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How to use it

  1. Enter your values

    Lower specification limit · Upper specification limit · Process mean · Within-process standard deviation

  2. Calculate / generate

    Calculate Cp and Cpk from a quality engineer’s validated process statistics.

  3. Result

    Potential capability (Cp): 1 Centered capability (Cpk): 0.666666667 Upper capability (Cpu): 0.666666667

Calculation method

  1. Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation.
  2. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index.
  3. Negative Cpk means the mean is outside a limit.
Cp = (USL−LSL)/(6σ); Cpu = (USL−μ)/(3σ); Cpl = (μ−LSL)/(3σ); Cpk = min(Cpu,Cpl)
Example scenario

Process capability index worksheet

Lower specification limit
8
Upper specification limit
20
Process mean
16
Within-process standard deviation
2
Result
Potential capability (Cp): 1
Centered capability (Cpk): 0.666666667
Upper capability (Cpu): 0.666666667

Frequently asked questions

Does a high index prove conformity?

No. Stable, approximately normal data and a reliable within-process deviation are prerequisites. This is not a stability test, sampling plan, confidence interval or certification; do not substitute variance for standard deviation.

Where does my data go?

Calculations run on your device. Form inputs are not sent to a server.

Terms and definitions

Enter your values

Lower specification limit

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation.

Enter a numerical value for this quantity.

Minimum: -1000000000000 · Maximum: 1000000000000

Upper specification limit

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation.

Enter a numerical value for this quantity.

Minimum: -1000000000000 · Maximum: 1000000000000

Process mean

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation.

Enter a numerical value for this quantity.

Minimum: -1000000000000 · Maximum: 1000000000000

Within-process standard deviation

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation.

Enter a numerical value for this quantity.

Minimum: 1e-12 · Maximum: 1000000000000

Result

Result

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index. Negative Cpk means the mean is outside a limit.

Calculated from your entries using the method below.

Potential capability (Cp)

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index. Negative Cpk means the mean is outside a limit.

Calculated from your entries using the method below.

Centered capability (Cpk)

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index. Negative Cpk means the mean is outside a limit.

Calculated from your entries using the method below.

Upper capability (Cpu)

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index. Negative Cpk means the mean is outside a limit.

Calculated from your entries using the method below.

Value

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index. Negative Cpk means the mean is outside a limit.

Calculated from your entries using the method below.

Unit

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation.

Calculated from your entries using the method below.

Lower capability (Cpl)

Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation. Cp compares tolerance width with six standard deviations; Cpk is the smaller one-sided index. Negative Cpk means the mean is outside a limit.

Calculated from your entries using the method below.

Common mistakes and quick fixes

Does a high index prove conformity?

Mistake: Treating a result as valid outside the described scope.

Fix: No. Stable, approximately normal data and a reliable within-process deviation are prerequisites. This is not a stability test, sampling plan, confidence interval or certification; do not substitute variance for standard deviation.

Limits and key assumptions

  • No. Stable, approximately normal data and a reliable within-process deviation are prerequisites. This is not a stability test, sampling plan, confidence interval or certification; do not substitute variance for standard deviation.
  • Use one consistent measurement unit for both specification limits, the process mean and within-process standard deviation.
  • Negative Cpk means the mean is outside a limit.
  • Displayed results may be rounded; rounding does not add measurement precision.